老外的晶体管测试仪又更新了

xo304

16. For capacitors with a capacity value above 5000pF the voltage loss after a load pulse can be
determined. The voltage loss give a hint for the quality factor of the capacitor.
17. Up to two diodes are shown with symbol or symbol in correct order. Additionally
the
ux voltages are shown.
18. LED is detected as diode, the
ux voltage is much higher than normal. Two-in-one LEDs are
also detected as two diodes.
19. Zener-Diodes can be detected, if reverse break down Voltage is below 4.5V. These are shown as
two diodes, you can identify this part only by the voltages. The outer probe numbers, which
surround the diode symbols, are identical in this case. You can identify the real Anode of the
diode only by the one with break down (threshold) Voltage nearby 700mV!
20. If more than 3 diode type parts are detected, the number of founded diodes is shown additionally
to the fail message. This can only happen, if Diodes are attached to all three probes and at
least one is a Z-Diode. In this case you should only connect two probes and start measurement
again, one after the other.
21. Measurement of the capacity value of a single diode in reverse direction. Bipolar Transistors
can also be analysed, if you connect the Base and only one of Collector or Emitter.
22. Only one measurement is needed to nd out the connections of a bridge rectier.
23. Capacitors with value below 25pF are usually not detectet, but can be measured together with
a parallel diode or a parallel capacitor with at least 25pF. In this case you must subtract the
capacity value of the parallel connected part.
24. For resistors below 2100
also the measurement of inductance will be done, if your ATmega
has at least 16K
ash memory. The range will be from about 0:01mH to more than 20H,
but the accuracy is not good. The measurement result is only shown with a single component
connected.
25. Testing time is about two seconds, only capacity or inductance measurement can cause longer
period.
26. Software can be congured to enable series of measurements before power will be shut down.
27. Build in selftest function with optional 50Hz Frequency generator to check the accuracy of
clock frequency and wait calls (ATmega168 and ATmega328 only).
28. Selectable facility to calibrate the internal port resistance of port output and the zero oset
of capacity measurement with the selftest (ATmega168 and ATmega328 only). A external
capacitor with a value between 100nF and 20F connected to pin 1 and pin 3 is necessary to
compensate the oset voltage of the analog comparator. This can reduce measurement errors
of capacitors of up to 40F. With the same capacitor a correction voltage to the internal
reference voltage is found to adjust the gain for ADC measuring with the internal reference.
29. Display the Collector cuto current ICE0 with currentless base (10A units) and Collector
residual current ICES with base hold to emitter level (ATmega328 only). This values are only
shown, if they are not zero (especially for Germanium transistors).
30. For the ATmega328 a dialog function can be selected, which enable additional functions. Of
course you can return from dialog to the normal Transistor Tester function.

xo304

31. With dialog function you can use a frequency measurement at port PD4 of the ATmega. The
resolution is 1 Hz for input frequencies above 25 kHz. For lower frequencies the resolution can
be up to 0:001 mHz by measuring the mean period.
32. With the dialog function and without the activated serial output a external voltage of up to
50V can be measured with the 10:1 voltage divider at the PC3 port. If the PLCC-Version of
the ATmega328 is used, one of the additional pins can be used for the voltage measurement
together with the serial output. If the zener diode measurement extension (DC-DC converter)
is assembled, the measurement of zener diodes is also possible with this function by pressing
the key.
33. With the dialog function a frequency output can be selected at the TP2 pin (PB2 Port of the
ATmega). Currently a preselection of frequencies from 1 Hz up to 2 MHz can be selected.
34. With the dialog function a xed frequency output with selectable pulse width can be activated
at the TP2 pin (PB2 port of the ATmega). The width can be enhanced with 1% by a short
key press or with 10% by a longer key press.
35. With the dialog function can be started a separated capacity measurement with ESR measure-
ment. Capacities from about 2F up to 50mF can most be measured in circuit, because only a
little measurement voltage of about 300mV is used. You should make shure, that all capacitors
have no residual charge before starting any measurement.
Thyristors and Triacs can only be detected, if the test current is above the holding current. Some
Thyristors and Triacs need as higher gate trigger current, than this Tester can deliver. The available
testing current is only about 6mA! Notice that many features can only be used with microcontroller
with enough program memory such as ATmega168. Only processors with at least 32k
ash memory
like ATmega328 or ATmega1284 can take all features.
Attention: Allways be shure to discharge capacitors before connecting them to the
Tester! The Tester may be damaged before you have switched it on. There is only a little protection
at the ATmega ports.
Extra causion is required if you try to test components mounted in a circuit. In either case the
equipment should be disconnected from power source and you should be shure, that no residual
voltage remains in the equipmen

xo304

功能眼花缭乱了,不追了.够用就行.

xo304

旋转编码器也用上了.选择菜单是方便了很多.

jkj

比以前的复杂了很多，功能要研究一下...

hp34401a

xo304 发表于 2014-12-1 00:06
TransistorTester with AVR microcontroller
and a little more
Version 1.11k

有否原始网页地址？

ccser

http://www.mikrocontroller.net/svnbrowser/transistortester/

这个应该是源网站，看看。

kirich

I also did a similar device. But I can not give here the link.
my version was better and more convenient

barons

看看哈

乐在其中110

看不懂这个。