老外的晶体管测试仪又更新了

我就是我

pdwdwdw 发表于 2014-11-29 23:06
新版增加了晶体测试和平率测试 ，单片用atmega64估计也行，管教都兼容的

估计用M64不行，带差分输入的MCU会影响测试

gedas

复杂多了。。。。

ad2000

真够复杂的了

xo304

给个链接呀.

pdwdwdw

我就是我 发表于 2014-11-30 01:48
估计用M64不行，带差分输入的MCU会影响测试

怪不得,移植到m128上边,电容测试老实不准,一直找不到原因,估计是你说的这个问题

AMD

有程序么
?

wooz

楼主给个链接吧

看上去：
两档晶振测试、频率输出、升压到30V测试稳压二极管
功能很不错，哪位开板团购了。

xo304

TransistorTester with AVR microcontroller
and a little more
Version 1.11k
Karl-Heinz Kubbeler
kh kuebbeler@web.de
November 2, 2014

xo304

Chapter 1
Features
1. Operates with ATmega8, ATmega168 or ATmega328 microcontrollers. Additionally ATmega1280
or ATmega2560 microcontrollers can be used.
2. Displaying the results to a 2x16 or a 4x16 character LCD-Display.
3. One key operation with automatic power shutdown.
4. Battery operation is possible since shutdown current is only about 20nA.
5. Low cost version is feasible without crystal and auto power o. With software version 1.05k
the sleep modus of the Atmega168 or ATmega328 is used to reduce current if no measurement
is required.
6. Automatic detection of NPN and PNP bipolar transistors, N- and P-Channel MOSFETs,
JFETs, diodes, double diodes, Thyristors and Triacs.
7. Automatic detection of pin layout of the detected part.
8. Measuring of current amplication factor and Base-Emitter threshold voltage of bipolar tran-
sistors.
9. Darlington transistors can be identied by the threshold voltage and high current amplication
factor.
10. Detection of the protection diode of bipolar transistors and MOSFETs.
11. Measuring of the Gate threshold voltage and Gate capacity value of MOSFETs.
12. Up to two Resistors are measured and shown with symbols and values with up to four
decimal digits in the right dimension. All symbols are surrounded by the probe numbers of the
Tester (1-3). So Potentiometer can also be measured. If the Potentiometer is adjusted to one
of its ends, the Tester cannot dier the middle pin and the end pin.
13. Resolution of resistor measurement is now up to 0:01
, values up to 50M
are detected.
14. One capacitor can be detected and measured. It is shown with symbol and value with up
to four decimal digits in the right dimension. The value can be from 25pF (8MHz clock, 50pF
@1MHz clock) to 100mF. The resolution can be up to 1pF (@8MHz clock].
15. For capacitors with a capacity value above 0:18F the Equivalent Serial Resistance (ESR) is
measured with a resolution of 0:01
and is shown with two signicant decimal digits. This fea-
ture is only avaiable for ATmega with at least 16K
ash memory (ATmega168 or ATmega328).

xo304

16. For capacitors with a capacity value above 5000pF the voltage loss after a load pulse can be
determined. The voltage loss give a hint for the quality factor of the capacitor.
17. Up to two diodes are shown with symbol or symbol in correct order. Additionally
the
ux voltages are shown.
18. LED is detected as diode, the
ux voltage is much higher than normal. Two-in-one LEDs are
also detected as two diodes.
19. Zener-Diodes can be detected, if reverse break down Voltage is below 4.5V. These are shown as
two diodes, you can identify this part only by the voltages. The outer probe numbers, which
surround the diode symbols, are identical in this case. You can identify the real Anode of the
diode only by the one with break down (threshold) Voltage nearby 700mV!
20. If more than 3 diode type parts are detected, the number of founded diodes is shown additionally
to the fail message. This can only happen, if Diodes are attached to all three probes and at
least one is a Z-Diode. In this case you should only connect two probes and start measurement
again, one after the other.
21. Measurement of the capacity value of a single diode in reverse direction. Bipolar Transistors
can also be analysed, if you connect the Base and only one of Collector or Emitter.
22. Only one measurement is needed to nd out the connections of a bridge rectier.
23. Capacitors with value below 25pF are usually not detectet, but can be measured together with
a parallel diode or a parallel capacitor with at least 25pF. In this case you must subtract the
capacity value of the parallel connected part.
24. For resistors below 2100
also the measurement of inductance will be done, if your ATmega
has at least 16K
ash memory. The range will be from about 0:01mH to more than 20H,
but the accuracy is not good. The measurement result is only shown with a single component
connected.
25. Testing time is about two seconds, only capacity or inductance measurement can cause longer
period.
26. Software can be congured to enable series of measurements before power will be shut down.
27. Build in selftest function with optional 50Hz Frequency generator to check the accuracy of
clock frequency and wait calls (ATmega168 and ATmega328 only).
28. Selectable facility to calibrate the internal port resistance of port output and the zero oset
of capacity measurement with the selftest (ATmega168 and ATmega328 only). A external
capacitor with a value between 100nF and 20F connected to pin 1 and pin 3 is necessary to
compensate the oset voltage of the analog comparator. This can reduce measurement errors
of capacitors of up to 40F. With the same capacitor a correction voltage to the internal
reference voltage is found to adjust the gain for ADC measuring with the internal reference.
29. Display the Collector cuto current ICE0 with currentless base (10A units) and Collector
residual current ICES with base hold to emitter level (ATmega328 only). This values are only
shown, if they are not zero (especially for Germanium transistors).
30. For the ATmega328 a dialog function can be selected, which enable additional functions. Of
course you can return from dialog to the normal Transistor Tester function.